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Bayesian accelerated life test plans for series systems with Weibull component lifetimes

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dc.contributor.author Soumya Roy
dc.date.accessioned 2018-06-28T07:26:51Z
dc.date.available 2018-06-28T07:26:51Z
dc.date.issued 2018-10
dc.identifier.uri http://hdl.handle.net/2259/1001
dc.description Volume 62, October 2018, Pages 383-403 https://doi.org/10.1016/j.apm.2018.06.007 en_US
dc.description.abstract This article presents optimal Bayesian accelerated life test plans for series systems under Type-I censoring scheme. First, the component lifetimes are assumed to follow independent Weibull distributions. The scale parameters of Weibull lifetime distributions are related to the external stress variable through a general stress translation function. For a fixed number of design points, optimal Bayesian ALT plans are first obtained by solving constrained optimization problems under two different Bayesian design criteria. The global optimality of the resulting fixed-point optimal designs is then verified via the General Equivalence Theorem. This article also provides the optimized compromise ALT plans which are extremely useful in real-life applications. A detailed sensitivity analysis is then performed to find out the effect of various planning inputs on the resulting optimal Bayesian ALT plans. A simulation study is then conducted to visualize the resulting sampling variations from the optimal Bayesian ALT plans. Finally, this article considers a series system with dependent component lifetimes. Optimal ALT plans are obtained assuming a Gamma frailty model. en_US
dc.language.iso en en_US
dc.publisher Elsevier: Applied Mathematical Modelling en_US
dc.subject Optimal Bayesian en_US
dc.subject Series Systems en_US
dc.subject Weibull component lifetimes en_US
dc.title Bayesian accelerated life test plans for series systems with Weibull component lifetimes en_US
dc.type Article en_US

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  • Journal Articles [24]
    This collection consists of published and unpublished scholarly articles of IIMK Community.

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